《Table 1.Average Thickness of DNA Thin Solid Films Made from Precursor Solutions with Various NaOH C

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《Irreversible denaturation of DNA: a method to precisely control the optical and thermo-optic properties of DNA thin solid films》

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For DNA thin solid films fabricated by spin-coating on Si substrates，the refractive indices and film thickness were measured using a Wollam ellipsometry system，and the results are summarized in Fig.5 and Table 1.Here we used the isotropic Cauchy model[7，10]because there are no resonant absorption bands in the DNA thin films in the spectral range from 380 to 900 nm.It has been reported that the refractive indices of DNA thin films depend on the film thickness[11]since the surface interaction between the substrate and the film is influenced by the film thickness.In order to focus on the impacts of DNA denaturation on the refractive index，we optimized the spin-coating process to fabricate films with nearly the same thickness of～40 nm.We found that the viscosity of the NaOH-DNA precursor solution decreased as the NaOH concentration increased or，equivalently，the level of denaturation increased.The thin film process was optimized for NaOH-DNA solution precursors with various viscosities by varying the spinning speed in the range from 750 to800 r/min，which compensates for the viscosity difference and provides nearly the same film thickness.