《表1[CuI (L1) 4] (Cl O4) 2的单晶结构数据》

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《新型四硫富瓦烯-吡啶型半导体材料的制备、晶体结构及电学性能表征（英文）》

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X-ray diffraction data were collected on a Bruker SMARTCCDdiffractometeratroom temperature with a graphite monochromated Mo Kαradiation（λ=0.71070）.The crystal structure was solved by direct methods within SHELXS-97[19]，and refined by full matrix least-squares methods on F2by means of SHELXL-97.All non-hydrogen atoms were refined anisotropically.The hydrogen atoms were introduced at calculated positions.Final refinement was performed with modification of the structure factors for contribution of the disordered solvent electron densities using the SQUEEZE option of PLATON[20].Details of crystal data，data collections，and structure refinement are summarized in Tab.1.All data（except structure factors）have been deposited with the Cambridge Crystal-lographic Data Centre as supplementary publications CCDC1864958 for[CuI（L1）4]（ClO4）2in this paper.Copies of the data can be obtained free of charge by application to CCDC，12 Union Road，Cambridge CB21EZ，UK（[email protected]）.