《Tab.7 Reduction of Ncritical_bitand average SFRby LUT inversion》
本系列图表出处文件名:随高清版一同展现
《对FPGA配置码点软错误敏感性的细粒度研究(英文)》
Four out of the eight benchmarks were selected to demonstrate the benefit of this method.Tab.7shows the reduction percentage in the number of critical bits and the reduction in average SFR.The results show that the SFRfor PIPs is indeed reduced as expected.The number of critical PIP bits is also reduced.Interestingly,the inversion of signals can impact the logical masking which can either increase or decrease the sensitivity of LUTs and MUXes.However,results in section 6.1showed that the PIPs represent the largest number of bits and are most critical,thus the overall result is positive in all cases.Tab.8gives MTTFimprovement for these four circuits due to LUT inversion.
图表编号 | XD0030788600 严禁用于非法目的 |
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绘制时间 | 2019.02.01 |
作者 | 连彩江、罗毅、ADRIAN Evans、WEN Shijie、陈更生 |
绘制单位 | 复旦大学专用集成电路与系统国家重点实验室、复旦大学专用集成电路与系统国家重点实验室、IROC Technologies、思科系统公司总部、复旦大学专用集成电路与系统国家重点实验室 |
更多格式 | 高清、无水印(增值服务) |