《Tab.6 Comparisons betw een the optimized order and baselines by varying test pow er》

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《三维集成电路绑定中测试成本缩减的优化堆叠顺序（英文）》

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Tab.6 presents our experimental results of the impact of test pow er on test cost compared w ith the baseline scheme in sequentially stacking.In order to analyze the impact of test TSVs on total test costs，the variable pow er_max w hich means the maximum test pow er available，the maximum TAM w idth available tam_max，and the maximum number of test elevators（test TSVs）betw een every tw o layers tsv_max are set to be 50 to 80，105，and 100.Tab.6 illustrates that compared w ith baseline 1，our proposed stack reordering scheme can reduce test costs by around14.63%in maximum and 13.71%more or less on average.Compared w ith baseline 2，the optimal order can save test costs by around 65.55%and 63.09%on average.