《Table 3.Typical impurity line emissions measured with the VUV_20 cm system from HL-2A plasmas.》
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《High-speed VUV spectroscopy for edge impurity line emission measurements in HL-2A tokamak》
The time behaviors of several impurity line emissions are investigated after the VUV_20 cm system is installed in the HL-2A device.The intensity of most typical line emissions in the wavelength range of 900–1500?is so strong that the attenuator with coefficient of C???1 is generally needed in the data acquisition process in the HL-2A experiments.Then，the edge impurity behaviors in the H-mode with ELMs are investigated.The result indicates that the effect of ELM on the edge impurity line emissions can be clearly identified and the time response of those line emissions to the ELMs are similar with that of Dαin the main plasma chamber.In the future，the frequency of the data acquisition will be increased to 1 MHz.It could expect that more details of the edge impurity behaviors in relation to the H-mode physics could be studied with the fast time response VUV_20 cm system.
| 图表编号 | XD0015684900 严禁用于非法目的 |
|---|---|
| 绘制时间 | 2018.10.01 |
| 作者 | 郑典麟、张凯、崔正英、孙平、董春凤、卢平、傅炳忠、刘泽田、石中兵、杨青巍 |
| 绘制单位 | Southwestern Institute of Physics、Southwestern Institute of Physics、Southwestern Institute of Physics、Southwestern Institute of Physics、Southwestern Institute of Physics、Southwestern Institute of Physics、Southwestern Institute of Physics、Southwestern Inst |
| 更多格式 | 高清、无水印（增值服务） |
