《Optical characterization of epitaxial semiconductor layers》
| 作者 | 编者 |
|---|---|
| 出版 | 未查询到或未知 |
| 参考页数 | 429 |
| 出版时间 | 没有确切时间的资料 |
| ISBN号 | 354059129X — 求助条款 |
| PDF编号 | 811388298（仅供预览，未存储实际文件） |
| 求助格式 | 扫描PDF（若分多册发行，每次仅能受理1册） |
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高度相关资料
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- Low Temperature Epitaxial Growth of Semiconductors
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- CHARACTERIZATION OF SEMICONDUCTOR MATERIALS
- 1979 GIROUX & WILLISTON JAMESTOWN PUBLISHERS
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- ANALYTICAL TECHNIQUES FOR SEMICONDUCTOR MATERIALS AND PROCESS CHARACTERIZATION
- 1992 ELECTROCHEMICAL SOCIETY INC
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- Surface characterization of biomaterials
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- Characterization of proteins
- 1988 Humana Press
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- INTERACTION OF PLANE-PARALLEL DOUBLE LAYERS
- 1963 THE M.I.T.PRESS
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- THE OUTER LAYERS OF A STAR
- 1953 OXFORD AT THE CLARENDON PRESS
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- GROWTH AND CHARACTERIZATION OF MATERIALS FOR INFRARED DETECTORS AND NONLINEAR OPTICAL SWITCHES VOLUM
- 1991 SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
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- FOLDING OF VISCOUS LAYERS
- 1994 COLUMBIA UNIVERSITY PRESS·NWE YORK
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- MICROMECHANICS OF CONTACT AND INTERPHASE LAYERS
- SPRINGER VERLAG
-
- ANALYSIS OF TURBULENT BOUNDARY LAYERS
- ACADEMIC PRESS
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