《Table 1NIST randomness test results》
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《A Novel RRAM Based PUF for Anti-Machine Learning Attack and High Reliability》
In order to get a more reliable random authentication result，we generated a 128×4 000 000 bit key.It is divided into 50 groups，and each group has 10 240 000 bit to do the NIST test.The NIST test results are shown in Table 1.The P-values of each test item are all greater than the significant level of 0.01，and there are 6 items with P-value values exceeding 0.5，which proves that the key sequence of the XOR RRAM PUF is random.
| 图表编号 | XD0042858900 严禁用于非法目的 |
|---|---|
| 绘制时间 | 2019.02.01 |
| 作者 | 戴澜、闫强强、易盛禹、刘文楷、钱鹤 |
| 绘制单位 | Academy of Electronic Information Engineering, North China University of Technology、Academy of Electronic Information Engineering, North China University of Technology、Academy of Electronic Information Engineering, North China University of Technology、Ins |
| 更多格式 | 高清、无水印（增值服务） |
